Four Probe Experiment, DFP-02 (Basic Model) Four Probe Experiment, DFP-02 (Basic Model) Four Probe Experiment, DFP-02 (Basic Model) Four Probe Experiment, DFP-02 (Basic Model)
Four Probe Experiment, DFP-02 (Basic Model)
Four Probe Experiment, DFP-02 (Basic Model) Four Probe Experiment, DFP-02 (Basic Model) Four Probe Experiment, DFP-02 (Basic Model)

Four Probe Experiment, DFP-02 (Basic Model)

Product Details:

  • Weight 8 Kg Kilograms (kg)
  • Application Laboratory Experiment
  • Material Electronics
  • Color Grey
  • Usage Laboratory Experiment
  • Supply Ability : 100 Set Per Month
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Price And Quantity

  • 1 Set
  • INR/Set

Product Specifications

  • Laboratory Experiment
  • 8 Kg Kilograms (kg)
  • Electronics
  • Laboratory Experiment
  • Grey

Trade Information

  • Telegraphic Transfer (T/T), Delivery Point (DP), Cheque, Cash in Advance (CID), Cash Advance (CA), Cash on Delivery (COD), Cash Against Delivery (CAD)
  • 100 Set Per Month
  • 1 Week
  • Contact us for information regarding our sample policy
  • Africa, Middle East, Western Europe, Eastern Europe, South America, North America, Central America, Australia, Asia
  • All India
  • ISO 9001: 2015 CE

Product Description

We manufacture, export and supply Four Probe Method to our customers in Roorkee, Uttarakhand, India. The Four Probe Method is one of the standard and most widely used method for the measurement of resistivity of semiconductors. The experimental arrangement is illustrated. In its useful form, the four probes are collinear. The error due to contact resistance, which is specially serious in the electrical measurement on semiconductors, is avoided by the use of two extra contacts (probes) between the current contacts. In this arrangement the contact resistance may all be high compare to the sample resistance, but as long as the resistance of the sample and contact resistances are small compared with the effective resistance of the voltage measuring device (potentiometer, electrometer or electronic voltmeter), the measured value will remain unaffected. Because of pressure contacts, the arrangement is also specially useful for quick measurement on different samples or sampling different parts of the same sample.

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