Four Probe Experiment, DFP-02 (Basic Model)

Product Description

We manufacture, export and supply Four Probe Method to our customers in Roorkee, Uttarakhand, India. The Four Probe Method is one of the standard and most widely used method for the measurement of resistivity of semiconductors. The experimental arrangement is illustrated. In its useful form, the four probes are collinear. The error due to contact resistance, which is specially serious in the electrical measurement on semiconductors, is avoided by the use of two extra contacts (probes) between the current contacts. In this arrangement the contact resistance may all be high compare to the sample resistance, but as long as the resistance of the sample and contact resistances are small compared with the effective resistance of the voltage measuring device (potentiometer, electrometer or electronic voltmeter), the measured value will remain unaffected. Because of pressure contacts, the arrangement is also specially useful for quick measurement on different samples or sampling different parts of the same sample.

Precision Measurement for Laboratories

The DFP-02 Four Probe Experiment device is tailored for laboratory environments that require accurate measurement of material resistance. Its robust electronic construction ensures consistency and reliability for both routine and advanced scientific investigations.


Digital Readout for Easy Operation

Equipped with a digital display, the DFP-02 Basic Model allows clear and immediate readings of experimental data. This feature helps laboratory professionals conduct their measurements with improved efficiency and reduced risk of human error.


Engineered for Versatility and Durability

With its grey electronic casing and two available weight options-8 kg and 20 kg-the DFP-02 is built to cater to varying laboratory needs. Its durable design makes it a dependable choice for repeated use in academic and research laboratories.